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FN17: the 2017 final

The Fall 2017 final (250 points; the paper has no question 9). Work through it in order: each part gives its question in short and links to the page that solves it, and to its exam way where the page has one. Some point values are overwritten on the scan, so they read “about”. The exam ways of F1–F4 and M6 come with their rebuild in early December.

26 parts: all solved in the guide, 16 with an exam way.

FN17-1

FN17-1a (5 points)

How does DIBL change with channel length? Explain.

Full solution

FN17-1b (5 points)

With 1 nF of clock load, what decoupling capacitance keeps the supply droop under 10%? Explain.

Full solution · The exam way

FN17-1c (5 points)

How does an NMOS transistor’s threshold vary with oxide thickness? Explain.

Full solution

FN17-1d (5 points)

Why is low latency desirable in a clock distribution?

Full solution · The exam way

FN17-1e (5 points)

Name one mechanism of infant mortality, and how burn-in finds the chips it will kill early.

Full solution · The exam way

FN17-2

FN17-2a (10 points)

Two dynamic stages on ϕ1\phi_1 and ϕ1′\phi_1': how must the rising edge of ϕ1\phi_1 sit against that of ϕ1′\phi_1' to avoid a race?

Full solution

FN17-2b (10 points)

How must the falling edges sit to avoid collisions?

Full solution

FN17-2c (5 points)

With those clocks, the logic function and the delay from A rising to Y falling.

Full solution

FN17-3

FN17-3a (11 points)

A clock H-tree: the total delay from A to B, with Elmore delay for the wires.

Full solution · The exam way

FN17-3b (11 points)

With a buffer supply sensitivity of −0.1 at 1.2 V, the jitter from 10% supply noise.

Full solution · The exam way

FN17-3c

With 0.1 nH/mm of wire inductance, should inductance enter the delay analysis? Explain.

Its points are illegible on the scan.

Full solution · The exam way

FN17-4

FN17-4a (10 points)

Find a scan pattern that controls and observes a stuck-at-0 fault at node A: the values and their order.

Full solution · The exam way

FN17-4b (10 points)

After one clock, what scans out of the bad circuit, and what would the good one give?

Full solution · The exam way

FN17-5

FN17-5a (10 points)

Two flip-flops built from latches, the primed clocks 50 ps early, a 500 ps cycle: does it work with no logic?

Full solution · The exam way

FN17-5b (10 points)

The largest logic delay for which it works.

Full solution · The exam way

FN17-5c (10 points)

If (a) fails, how can ϕ1\phi_1 and ϕ2\phi_2 be changed so that it works?

Full solution · The exam way

FN17-5d (10 points)

The largest logic delay now.

Full solution · The exam way

FN17-6

FN17-6a (about 8 points)

A dynamic SRAM row decoder: sketch W0W_0, BB, B‾\overline{B} and data_out for the given inputs.

Full solution · The exam way

FN17-6b (8 points)

What does the decoder require of the non-overlap window of ϕ1\phi_1 and ϕ2\phi_2?

Full solution · The exam way

FN17-7

FN17-7a (about 8 points)

With CB=0C_B = 0 and each input limited to 2 fF, size the path for minimum delay.

Full solution

FN17-7b (12 points)

With a 500 fF branch CBC_B, find a sizing close to the minimum delay.

Full solution

FN17-8 (15 points)

Draw an 8-bit parallel-prefix adder from PG cells, radix-2 lookahead elements and sum cells, with its critical path.

Full solution · The exam way

FN17-10

FN17-10a (about 8 points)

Eight 10 µm/5 µm inverters, Ioff=10I_{off} = 10 nA, 80 mV/decade: the on-current as a function of VDDV_{DD}.

Full solution

FN17-10b (about 8 points)

The chain’s delay as a function of VDDV_{DD}.

Full solution

FN17-10c (about 8 points)

The switching energy, leakage during the delay included, as a function of VDDV_{DD}; the VDDV_{DD} that minimizes it.

Full solution · The exam way

FN17-11 (10 points)

A dynamic three-input OR: what must the waveforms at A, B and C satisfy, collisions included, and what does Y look like?

Full solution